This course is to provide an overview of Statistical Process Control (SPC), and the approaches used to analyze both attribute and variable data defined in the Statistical Process Control reference manual. Dr. Walter A. Shewhart of Bell Telephone Laboratories developed the first control chart in the early 1920s. Since then Control charts have been used by industries worldwide as a mean for controlling and monitoring the stability of key process parameters. In recent years, the demand for the control charts as a process improvement tool has been tremendous, and it has become one of the core tools that need to be deployed in the organization that implements ISO/TS 16949 Quality Management System.
Duration: 2 Days (16 Hours)
Course Content:
- Introduce of SPC history
- Linkage to IATF16949:2016
- Understand the SPC concepts
- Select and use of variable and attribute control charts
- Interpret the control chart patterns
- Use of out-of-control rules
- Introduce concept and practical approach to process capability analysis
- Managing methodology of a successful SPC program within an organization
- Assessing objectively the stability of the manufacturing processes
- Deploying SPC program framework effectively within an organization